Deep Level Transient Spectroscopy (DLTS) is a unique and powerful tool for the study of electrically active defects in semiconductors. In DLTS a defect is observed by monitoring the effect of an emission of a carrier from a deep level to the valence band (p-type) or to the conduction band (n-type) . The transition from a deep level to the band (valence or conduction) is observed as a change in the capacitance.
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Deep Level Transient Spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a unique and powerful tool for the study of electrically active defects in semiconductors. In DLTS a defect is observed by monitoring the effect of an emission of a carrier from a deep level to the valence band (p-type) or to the conduction band (n-type) . The transition from a deep level to the band (valence or conduction) is observed as a change in the capacitance.
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Deep_Level_Transient_Spectroscopy
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